Critical electron emission from dielectric induced by injection of nanosecond electron beam

Author

Nedorezova, N. ; Tavanov, Eduard

Author_Institution

Tomsk Polytech. Univ., Russia

Volume

2

fYear

2004

fDate

26 June-3 July 2004

Firstpage

252

Abstract

High-current-density (HCD) electron beam of nanosecond pulse duration is applied for charge injection into various dielectrics to induce the critical electron emission from dielectric into vacuum. Critical electron emission from dielectric arises when current density exceeds critical value and induced point explosions of the microtips on the dielectric surface and ejections atom-ion plasmas from this points into vacuum. It is shown that critical electron emission induced by high-current-density injection of electrons arises in the form of gigantic single pulse, which is of peak value of 10-1000 A and delayed from injection one for 3-34 ns.

Keywords

charge injection; dielectric materials; electron beam effects; electron field emission; electron-surface impact; 10 to 1000 A; 3 to 34 ns; charge injection; critical electron emission; current density; dielectric surface; ejections atom-ion plasmas; gigantic single pulse; high-current-density electron beam; microtips; nanosecond electron beam injection; nanosecond pulse duration; point explosions; vacuum; Current density; Delay; Dielectric measurements; Electron beams; Electron emission; Electron traps; Electronics packaging; Plasma density; Surface discharges; Vacuum breakdown;

fLanguage

English

Publisher

ieee

Conference_Titel

Science and Technology, 2004. KORUS 2004. Proceedings. The 8th Russian-Korean International Symposium on

Print_ISBN

0-7803-8383-4

Type

conf

DOI

10.1109/KORUS.2004.1555611

Filename

1555611