Title :
Characterization of data complexity for SVM methods
Author :
Ma, Yunqian ; Cherkassky, Vladimir
Author_Institution :
Honeywell Labs., Honeywell Int. Inc., Minneapolis, MN, USA
fDate :
31 July-4 Aug. 2005
Abstract :
This paper provides new characterization of data complexity for margin-based methods also known as SVMs, kernel methods etc. Under the predictive learning setting, the complexity of a given data set is directly related to model complexity, i.e. the flexibility of a set of admissible models used to describe this data. There are two distinct approaches to model complexity control: traditional model-based where complexity is controlled via parameterization of admissible models, and margin-based where complexity is controlled by the size of margin (in a specially designed empirical loss function). This paper emphasizes the role of margin for complexity control, and proposes a simple index for data complexity suitable for classification and regression problems.
Keywords :
database management systems; learning (artificial intelligence); support vector machines; SVM; data complexity; data set; predictive learning; support vector machine; Bayesian methods; Function approximation; Kernel; Learning systems; Machine learning; Predictive models; Size control; Statistical learning; Support vector machine classification; Support vector machines;
Conference_Titel :
Neural Networks, 2005. IJCNN '05. Proceedings. 2005 IEEE International Joint Conference on
Print_ISBN :
0-7803-9048-2
DOI :
10.1109/IJCNN.2005.1555975