Title :
Kernel relevant component analysis for distance metric learning
Author :
Tsang, Ivor W. ; Cheung, Pak-Ming ; Kwok, James T.
Author_Institution :
Dept. of Comput. Sci., Hong Kong Univ. of Sci. & Technol., Kowloon, China
fDate :
31 July-4 Aug. 2005
Abstract :
Defining a good distance measure between patterns is of crucial importance in many classification and clustering algorithms. Recently, relevant component analysis (RCA) is proposed which offers a simple yet powerful method to learn this distance metric. However, it is confined to linear transforms in the input space. In this paper, we show that RCA can also be kernelized, which then results in significant improvements when nonlinearities are needed. Moreover, it becomes applicable to distance metric learning for structured objects that have no natural vectorial representation. Besides, it can be used in an incremental setting. Performance of this kernel method is evaluated on both toy and real-world data sets with encouraging results.
Keywords :
learning (artificial intelligence); pattern classification; pattern clustering; classification algorithms; clustering algorithms; distance metric learning; kernel relevant component analysis; linear transforms; Algorithm design and analysis; Classification algorithms; Clustering algorithms; Computer science; Euclidean distance; Kernel; Nearest neighbor searches; Pattern analysis; Principal component analysis; Surveillance;
Conference_Titel :
Neural Networks, 2005. IJCNN '05. Proceedings. 2005 IEEE International Joint Conference on
Print_ISBN :
0-7803-9048-2
DOI :
10.1109/IJCNN.2005.1555981