DocumentCode :
446424
Title :
OFDM performance analysis in the presence of synchronization errors induced by hot carriers
Author :
Herlekar, Sameer R. ; Wu, Hsiao-Chun ; Zhang, Chi ; Srivastava, Ashok
Volume :
3
fYear :
2005
fDate :
25-28 Sept., 2005
Firstpage :
1844
Lastpage :
1848
Keywords :
Degradation; Frequency synchronization; Hot carriers; MOSFET circuits; OFDM; Performance analysis; Phase noise; Radio frequency; System performance; Voltage-controlled oscillators;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Vehicular Technology Conference, 2005. VTC-2005-Fall. 2005 IEEE 62nd
ISSN :
1090-3038
Print_ISBN :
0-7803-9152-7
Type :
conf
DOI :
10.1109/VETECF.2005.1558425
Filename :
1558425
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=446424
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