• DocumentCode
    446424
  • Title

    OFDM performance analysis in the presence of synchronization errors induced by hot carriers

  • Author

    Herlekar, Sameer R. ; Wu, Hsiao-Chun ; Zhang, Chi ; Srivastava, Ashok

  • Volume
    3
  • fYear
    2005
  • fDate
    25-28 Sept., 2005
  • Firstpage
    1844
  • Lastpage
    1848
  • Keywords
    Degradation; Frequency synchronization; Hot carriers; MOSFET circuits; OFDM; Performance analysis; Phase noise; Radio frequency; System performance; Voltage-controlled oscillators;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Vehicular Technology Conference, 2005. VTC-2005-Fall. 2005 IEEE 62nd
  • ISSN
    1090-3038
  • Print_ISBN
    0-7803-9152-7
  • Type

    conf

  • DOI
    10.1109/VETECF.2005.1558425
  • Filename
    1558425
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=446424