Title :
Robust test set for flash AD converter
Author :
Salama, Aly E. ; Amer, Hassanein
Author_Institution :
Dept. of Electron. Eng., American Univ. in Cairo, Egypt
Abstract :
This paper presents a new test scheme for the flash AD converter. This converter is a mixed-signal circuit that produces the same digital output for a range of analog inputs. It is shown that the test coverage is 100 irrespective of component tolerances.
Keywords :
analogue-digital conversion; integrated circuit testing; mixed analogue-digital integrated circuits; flash AD converter; integrated circuit testing; mixed-signal circuit; Analog circuits; Analog-digital conversion; Circuit faults; Circuit testing; Degradation; Digital circuits; Robustness; System testing; System-on-a-chip; Voltage;
Conference_Titel :
Circuits and Systems, 2003 IEEE 46th Midwest Symposium on
Print_ISBN :
0-7803-8294-3
DOI :
10.1109/MWSCAS.2003.1562207
