DocumentCode :
446821
Title :
Optical characterization of single crystal silicon microlens fabricated by the ´MEMSNAS´ process
Author :
Maaty, Hesham ; Khalil, Diaa ; Bourouina, Tarik
Author_Institution :
Dept. of Electron. & Commun. Eng., Ain Shams Univ., Cairo
Volume :
2
fYear :
2003
fDate :
30-30 Dec. 2003
Firstpage :
1023
Abstract :
Single crystal silicon refractive microlenses are fabricated using MEMSNAS, a microfabrication process of 3D microstructures that uses only widespread techniques of microelectronics. Both the shape and optical properties of the fabricated microlenses are examined. The 3D profiles are measured using vertical scanning optical interferometry while the focal length is measured using spot size transformation created by the lens. The spot size is measured using the knife edge technique. The measured sag and lens diameter led to a calculated focal length ranging between 1.8mm and 1.95mm, while the optical measurement at 1.5 mum gives a focal length (f) between 1.2 and 2 mm
Keywords :
elemental semiconductors; etching; light interferometry; lithography; microlenses; micromechanical devices; optical fabrication; optical properties; silicon; 1.88 to 1.95 mm; 3D profile measurement; MEMSNAS process; focal length measurement; knife edge technique; microfabrication process; optical properties; single crystal silicon microlens; spot size measurement; spot size transformation; vertical scanning optical interferometry; Crystal microstructure; Length measurement; Lenses; Microelectronics; Microoptics; Optical interferometry; Optical refraction; Shape; Silicon; Size measurement; 3D Microfabrication; optical lens; silicon technology;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Circuits and Systems, 2003 IEEE 46th Midwest Symposium on
Conference_Location :
Cairo
ISSN :
1548-3746
Print_ISBN :
0-7803-8294-3
Type :
conf
DOI :
10.1109/MWSCAS.2003.1562462
Filename :
1562462
Link To Document :
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