• DocumentCode
    447614
  • Title

    PLL modeling method for integration in an IF receiver ASIC

  • Author

    Lagutere, Thierry ; Paillot, Jean-Marie ; Guegnaud, Hervé

  • Author_Institution
    EADS DEFENCE & SECURITY SYSTEMS SA, France
  • Volume
    1
  • fYear
    2004
  • fDate
    4-7 May 2004
  • Firstpage
    199
  • Abstract
    The architecture of an IF wireless receiver is presented. This component is designed using standard CMOS 0.35 μm process with 3.3 V power supply and is included in professional mobile radio-communications (PMR) applications. The method employed to verify its behavior is based on models written in VHDL-AMS language. A particular point highlighted in this article is the use of Verilog-A to find out the PLL phase noise and include it to a VHDL-AMS model. Evaluating PLL phase noise is not possible with transistor level simulations due to computing time. Results obtained with our Verilog-A model are inserted in the VHDL-AMS model. The purpose of utilizing those two languages is to take advantage of features needed to test our component. The VHDL-AMS allows simulating mixed signal transient behavior with VHDL digital modules with various simulators. The Verilog-A helps computing specific block phase noise properties using RF simulators such as Cadence Spectre-RF or mentor graphics Eldo-RF. Simulation results obtained with models are in good agreement with transistor level simulations and measurement results.
  • Keywords
    CMOS analogue integrated circuits; application specific integrated circuits; hardware description languages; mobile radio; phase locked loops; phase noise; radio receivers; transistors; 3.3 V; Cadence Spectre-RF; PLL modeling method; PLL phase noise; VHDL digital modules; VHDL-AMS language; Verilog-A model; intermediate frequency wireless receiver; mentor graphics Eldo-RF; mixed signal transient behavior simulation; professional mobile radiocommunications; transistor level simulations; Application specific integrated circuits; CMOS process; Computational modeling; Hardware design languages; Phase locked loops; Phase noise; Power supplies; Radio frequency; Semiconductor device modeling; Testing; IF; Modeling; PLL; VHDL-AMS; Verilog-AMS;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Industrial Electronics, 2004 IEEE International Symposium on
  • Print_ISBN
    0-7803-8304-4
  • Type

    conf

  • DOI
    10.1109/ISIE.2004.1571807
  • Filename
    1571807