DocumentCode :
447614
Title :
PLL modeling method for integration in an IF receiver ASIC
Author :
Lagutere, Thierry ; Paillot, Jean-Marie ; Guegnaud, Hervé
Author_Institution :
EADS DEFENCE & SECURITY SYSTEMS SA, France
Volume :
1
fYear :
2004
fDate :
4-7 May 2004
Firstpage :
199
Abstract :
The architecture of an IF wireless receiver is presented. This component is designed using standard CMOS 0.35 μm process with 3.3 V power supply and is included in professional mobile radio-communications (PMR) applications. The method employed to verify its behavior is based on models written in VHDL-AMS language. A particular point highlighted in this article is the use of Verilog-A to find out the PLL phase noise and include it to a VHDL-AMS model. Evaluating PLL phase noise is not possible with transistor level simulations due to computing time. Results obtained with our Verilog-A model are inserted in the VHDL-AMS model. The purpose of utilizing those two languages is to take advantage of features needed to test our component. The VHDL-AMS allows simulating mixed signal transient behavior with VHDL digital modules with various simulators. The Verilog-A helps computing specific block phase noise properties using RF simulators such as Cadence Spectre-RF or mentor graphics Eldo-RF. Simulation results obtained with models are in good agreement with transistor level simulations and measurement results.
Keywords :
CMOS analogue integrated circuits; application specific integrated circuits; hardware description languages; mobile radio; phase locked loops; phase noise; radio receivers; transistors; 3.3 V; Cadence Spectre-RF; PLL modeling method; PLL phase noise; VHDL digital modules; VHDL-AMS language; Verilog-A model; intermediate frequency wireless receiver; mentor graphics Eldo-RF; mixed signal transient behavior simulation; professional mobile radiocommunications; transistor level simulations; Application specific integrated circuits; CMOS process; Computational modeling; Hardware design languages; Phase locked loops; Phase noise; Power supplies; Radio frequency; Semiconductor device modeling; Testing; IF; Modeling; PLL; VHDL-AMS; Verilog-AMS;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Industrial Electronics, 2004 IEEE International Symposium on
Print_ISBN :
0-7803-8304-4
Type :
conf
DOI :
10.1109/ISIE.2004.1571807
Filename :
1571807
Link To Document :
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