Design and performance of a pulsed THz diffuse reflectance system

Author

Maragkos, N. ; Naftaly, M. ; Miles, R.E.

Author_Institution

Sch. of Electron. & Electr. Eng., Leeds Univ., UK

Volume

1

fYear

2005

fDate

19-23 Sept. 2005

Firstpage

14

Abstract

Diffuse reflectance spectroscopy in the visible and NIR is widely used to measure complex dielectric constants of highly scattering opaque materials. Compared with specular reflectance measurements, it has the advantages of low sensitivity to sample position and surface preparation, and improved accuracy in the determination of optical constants. We extend this technique to the THz range, describing the design and performance of a THz diffuse reflectance system.

Keywords

microwave reflectometry; optical constants; permittivity measurement; submillimetre wave measurement; submillimetre wave spectroscopy; NIR spectroscopy; complex dielectric constant measurement; diffuse reflectance spectroscopy; optical constants; pulsed THz diffuse reflectance system; specular reflectance measurements; visible spectroscopy; Dielectric measurements; Mirrors; Optical reflection; Optical scattering; Optical sensors; Position measurement; Reflectivity; Speckle; Spectroscopy; Zinc compounds;

fLanguage

English

Publisher

ieee

Conference_Titel

Infrared and Millimeter Waves and 13th International Conference on Terahertz Electronics, 2005. IRMMW-THz 2005. The Joint 30th International Conference on

Print_ISBN

0-7803-9348-1

Type

conf

DOI

10.1109/ICIMW.2005.1572383

Filename

1572383