Title :
THz evanescent field spectroscopy
Author :
Darmo, J. ; Kröll, J. ; Unterrainer, K.
Author_Institution :
Photonics Inst., Vienna Univ. of Technol., Austria
Abstract :
The attenuated total internal reflection spectroscopy at terahertz frequencies is considered. We have focused on the information carried by the interaction of the evanescent field with the optical material in the place of an optical tunneling barrier.
Keywords :
attenuated total reflection; optical materials; submillimetre wave spectroscopy; tunnelling; THz evanescent field spectroscopy; internal reflection spectroscopy; optical material; optical tunneling barrier; terahertz frequencies; Frequency; Optical attenuators; Optical materials; Optical pulse generation; Optical reflection; Optical refraction; Optical sensors; Optical surface waves; Spectroscopy; Tunneling;
Conference_Titel :
Infrared and Millimeter Waves and 13th International Conference on Terahertz Electronics, 2005. IRMMW-THz 2005. The Joint 30th International Conference on
Print_ISBN :
0-7803-9348-1
DOI :
10.1109/ICIMW.2005.1572385
