• DocumentCode
    447733
  • Title

    Measurement of the terahertz Faraday effect in III-V semiconductors

  • Author

    Sumikura, Hisashi ; Nagashima, Takeshi ; Hangyo, Masanori

  • Author_Institution
    Inst. of Laser Eng., Osaka Univ., Japan
  • Volume
    1
  • fYear
    2005
  • fDate
    19-23 Sept. 2005
  • Firstpage
    60
  • Abstract
    We have developed a magneto-optical measurement system in the terahertz region and measured the Faraday effect of III-V semiconductors. The system consists of a cryogen-free superconducting magnet, a refrigerator for samples and a terahertz time-domain spectroscopy system. In this study, we have investigated the magnetic field and temperature dependences of the Faraday ellipticity and rotation angle of Si-doped n-type GaAs. The frequency dependence of the ellipticity and rotation angle is well described by semi classical models, that is, the Drude model and the Boltzmann transport theory around room temperature. However, below ∼150K, both models are not appropriate to describe results because of the appearance of quantum effects.
  • Keywords
    Boltzmann equation; Faraday effect; III-V semiconductors; elemental semiconductors; gallium arsenide; semiconductor doping; silicon; submillimetre wave measurement; superconducting magnets; Boltzmann transport theory; Drude model; Faraday ellipticity; III-V semiconductors; Si-GaAs; cryogen-free superconducting magnet; frequency dependence; magnetic fields; magneto-optical measurement system; quantum effects; semi classical models; temperature dependence; terahertz Faraday effect; terahertz time-domain spectroscopy system; Faraday effect; III-V semiconductor materials; Magnetic field measurement; Magnetooptic effects; Refrigeration; Spectroscopy; Submillimeter wave measurements; Superconducting magnets; Temperature dependence; Time domain analysis;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Infrared and Millimeter Waves and 13th International Conference on Terahertz Electronics, 2005. IRMMW-THz 2005. The Joint 30th International Conference on
  • Print_ISBN
    0-7803-9348-1
  • Type

    conf

  • DOI
    10.1109/ICIMW.2005.1572406
  • Filename
    1572406