• DocumentCode
    447770
  • Title

    Numerical simulation of long wavelength photovoltaic HgCdTe photodiodes

  • Author

    Xu, XiangYan ; Lu, Wei ; Chen, Xiaoshuang ; Shen, Xuechu

  • Author_Institution
    Shanghai Inst. of Tech. Phys., Chinese Acad. of Sci., China
  • Volume
    1
  • fYear
    2005
  • fDate
    19-23 Sept. 2005
  • Firstpage
    156
  • Abstract
    In the paper the performance of n-on-p long wavelength photovoltaic Hg1-xCdxTe (x=0.224) photodiode has been simulated numerically. Calculation is based on 2D model for the backside-illuminated configuration. The influence of several factors, including p-type region thickness, the distance from p-type region contact to n+ area, n-side doping profile, and lifetime of electron, on R0A product and zero-bias photocurrent is studied. Simulation results show that R0A product decreases with increase in thickness of the p-type region. As the distance from p-type region contact to n+ area increases, R0A product increases, but quantum efficiency deceases, the optimized distance is about 100μm. The performance of photodiode is strongly dependent on minority carrier (electron) lifetime, but n-side doping profile is less important.
  • Keywords
    II-VI semiconductors; cadmium compounds; carrier lifetime; doping profiles; mercury compounds; p-n junctions; photodetectors; photodiodes; photovoltaic effects; semiconductor device models; Hg0.776Cd0.224Te; R0A product; backside-illuminated configuration model; electron lifetime; long wavelength photovoltaic photodiodes; minority carrier lifetime; n-on-p long wavelength photovoltaic Hg1-xCdxTe photodiode; n-side doping profile; p-type region contact; zero-bias photocurrent; Doping profiles; Electrons; Mercury (metals); Numerical simulation; Photoconductivity; Photodiodes; Photovoltaic systems; Semiconductor process modeling; Solar power generation; Tellurium;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Infrared and Millimeter Waves and 13th International Conference on Terahertz Electronics, 2005. IRMMW-THz 2005. The Joint 30th International Conference on
  • Print_ISBN
    0-7803-9348-1
  • Type

    conf

  • DOI
    10.1109/ICIMW.2005.1572455
  • Filename
    1572455