Measurement of loss tangent of dielectric and semiconductor materials at millimeter waves and temperatures 0.9-300 K

Author

Derkach, V.N. ; Golovashehenko, R.V. ; Nedukh, S.V. ; Plevako, A.S. ; Tarapov, S.I.

Author_Institution

Usikov Inst. of Radiophys., Ukraine Electron. of Nat. Acad. of Sci., Kharkov, Ukraine

Volume

1

fYear

2005

fDate

19-23 Sept. 2005

Firstpage

192

Abstract

Technique for measurement of low loss dielectric and semiconductor materials at frequencies 30-140 GHz and temperatures T=0.6-300 K is presented. Features of the experimental low temperature complex are described. Whispering gallery disk dielectric resonator (WGDDR) method is applied to measure loss tangent for several promising technology materials. Temperature dependences of loss tangents are obtained for materials under test and presented in report.

Keywords

dielectric loss measurement; dielectric materials; dielectric resonators; materials testing; millimetre wave measurement; semiconductor materials; 0.9 to 300 K; 30 to 140 GHz; dielectric materials; loss tangent measurement; millimeter waves; semiconductor materials; whispering gallery disk dielectric resonator; Dielectric loss measurement; Dielectric losses; Dielectric materials; Dielectric measurements; Frequency measurement; Loss measurement; Millimeter wave measurements; Millimeter wave technology; Semiconductor materials; Temperature;

fLanguage

English

Publisher

ieee

Conference_Titel

Infrared and Millimeter Waves and 13th International Conference on Terahertz Electronics, 2005. IRMMW-THz 2005. The Joint 30th International Conference on

Print_ISBN

0-7803-9348-1

Type

conf

DOI

10.1109/ICIMW.2005.1572473

Filename

1572473