• DocumentCode
    447789
  • Title

    Development of a millimeter wave magnetic resonance force microscopy probe

  • Author

    Toda, M. ; Ohno, N. ; Fujita, T. ; Kanernaki, T. ; Mitsudo, S. ; Ogawa, I. ; Idehara, T. ; Fujii, Yuka ; Chiba, M. ; Lee, Y.J. ; Markert, J.T.

  • Author_Institution
    Res. Center for Dev. of Far-Infrared Region, Fukui Univ., Japan
  • Volume
    1
  • fYear
    2005
  • fDate
    19-23 Sept. 2005
  • Firstpage
    203
  • Abstract
    X-band probe for magnetic resonance force microscopy (MRFM) has been developed, and the instrumental characteristics have been estimated. For the examination of the system, we have performed the MRFM experiments on a few nanogram 1,1-diphenyl-2-picrylhydrazyl (DPPH) sample mounted on a cantilever. It has been shown that the system has a signal sensitivity of 106μB and a spatial resolution of a few μm.
  • Keywords
    electron probes; magnetic force microscopy; millimetre wave detectors; X-band probe; magnetic resonance force microscopy probe; millimeter wave probe; nanogram 1,1-diphenyl-2-picrylhydrazyl sample; Frequency; Gyrotrons; Magnetic force microscopy; Magnetic resonance; Millimeter wave technology; Nuclear magnetic resonance; Optical fiber polarization; Physics; Probes; Spatial resolution;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Infrared and Millimeter Waves and 13th International Conference on Terahertz Electronics, 2005. IRMMW-THz 2005. The Joint 30th International Conference on
  • Print_ISBN
    0-7803-9348-1
  • Type

    conf

  • DOI
    10.1109/ICIMW.2005.1572479
  • Filename
    1572479
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=447789