DocumentCode :
447789
Title :
Development of a millimeter wave magnetic resonance force microscopy probe
Author :
Toda, M. ; Ohno, N. ; Fujita, T. ; Kanernaki, T. ; Mitsudo, S. ; Ogawa, I. ; Idehara, T. ; Fujii, Yuka ; Chiba, M. ; Lee, Y.J. ; Markert, J.T.
Author_Institution :
Res. Center for Dev. of Far-Infrared Region, Fukui Univ., Japan
Volume :
1
fYear :
2005
fDate :
19-23 Sept. 2005
Firstpage :
203
Abstract :
X-band probe for magnetic resonance force microscopy (MRFM) has been developed, and the instrumental characteristics have been estimated. For the examination of the system, we have performed the MRFM experiments on a few nanogram 1,1-diphenyl-2-picrylhydrazyl (DPPH) sample mounted on a cantilever. It has been shown that the system has a signal sensitivity of 106μB and a spatial resolution of a few μm.
Keywords :
electron probes; magnetic force microscopy; millimetre wave detectors; X-band probe; magnetic resonance force microscopy probe; millimeter wave probe; nanogram 1,1-diphenyl-2-picrylhydrazyl sample; Frequency; Gyrotrons; Magnetic force microscopy; Magnetic resonance; Millimeter wave technology; Nuclear magnetic resonance; Optical fiber polarization; Physics; Probes; Spatial resolution;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Infrared and Millimeter Waves and 13th International Conference on Terahertz Electronics, 2005. IRMMW-THz 2005. The Joint 30th International Conference on
Print_ISBN :
0-7803-9348-1
Type :
conf
DOI :
10.1109/ICIMW.2005.1572479
Filename :
1572479
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=447789
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