• DocumentCode
    44790
  • Title

    Communicating Novel Computational State Variables: Post-CMOS Logic

  • Author

    Rakheja, Shaloo ; Naeemi, Azad

  • Author_Institution
    School of Electrical and Computer Engineering, Georgia Institute of Technology, Atlanta, GA 30332 USA
  • Volume
    7
  • Issue
    1
  • fYear
    2013
  • fDate
    Mar-13
  • Firstpage
    15
  • Lastpage
    23
  • Abstract
    The semiconducting material silicon forms the heart of the current complimentary metal?oxide semiconductor (CMOS) technology. Over the last four decades, the productivity of silicon technology has increased by a factor of more than a billion [1]. This growth in silicon technology was made possible by a steady reduction in the feature size, which helps pack more functionality per cost in a microprocessor. Today, the silicon-based semiconductor industry is an approximately US$270 billion market [1]. This exponential growth of the semiconductor industry was first observed by Dr. Gordon Moore. In 1965, Moore observed that the computing power of a microprocessor doubled every 18?24 months, and this observation later became known as Moore?s law [2]. In essence, Moore?s law is an economic law that serves to guide long-term planning and to set targets for research and development in the semiconductor industry. However, quantum-mechanical laws dictate that there are fundamental challenges associated with scaling on-chip components to below 10 nm [3]. A revolutionary innovation in semiconductor technology would be needed to sustain Moore?s law for advanced technology nodes below 10 nm [1], [4]. We examine performance trends of on-chip devices and interconnects upon dimensional scaling. This is followed by a discussion on emerging technologies and the repercussions of interconnects for these novel technologies.
  • Keywords
    CMOS technology; Energy dissipation; Excitons; FETs; Logic gates; Semiconductor materials; Silicon;
  • fLanguage
    English
  • Journal_Title
    Nanotechnology Magazine, IEEE
  • Publisher
    ieee
  • ISSN
    1932-4510
  • Type

    jour

  • DOI
    10.1109/MNANO.2012.2237314
  • Filename
    6450165