• DocumentCode
    448013
  • Title

    Photoionization of trapped carriers in avalanche photodiodes to reduce afterpulsing during Geiger-mode photon counting

  • Author

    Krainak, Michael A.

  • Author_Institution
    NASA Goddard Space Flight Center, Greenbelt, MD, USA
  • Volume
    1
  • fYear
    2005
  • fDate
    22-27 May 2005
  • Firstpage
    588
  • Abstract
    We reduced the afterpulsing probability by a factor of five in a Geiger-mode photon-counting InGaAs avalanche photodiode by using sub-band-gap (λ=1.95 μm) laser diode illumination, which we believe photoionizes the trapped carriers.
  • Keywords
    III-V semiconductors; avalanche photodiodes; gallium arsenide; indium compounds; photoionisation; photon counting; semiconductor lasers; 1.95 micron; Geiger-mode photon counting; InGaAs; afterpulsing probability; avalanche photodiodes; photoionization; sub-band-gap laser diode illumination; trapped carriers; Avalanche photodiodes; Charge carrier processes; Detectors; Indium gallium arsenide; Ionization; Lighting; Optical filters; Photonic band gap; Photonics Society; Temperature;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Lasers and Electro-Optics, 2005. (CLEO). Conference on
  • Print_ISBN
    1-55752-795-4
  • Type

    conf

  • DOI
    10.1109/CLEO.2005.201856
  • Filename
    1572922