• DocumentCode
    448170
  • Title

    Determining thickness independently from optical constants using ultrafast spectral interferometry

  • Author

    Huang, Feng ; Federici, John F. ; Gary, Dale ; Jedju, Thomas ; Warren, Warren S.

  • Author_Institution
    Dept. of Phys., New Jersey Inst. of Technol., Newark, NJ, USA
  • Volume
    2
  • fYear
    2005
  • fDate
    22-27 May 2005
  • Firstpage
    1103
  • Abstract
    We show that the application of ultrafast techniques, specially femtosecond lasers, allow simultaneous measurements of material thickness and optical constants from transmission measurements using a frequency interferometer.
  • Keywords
    high-speed optical techniques; light interferometry; measurement by laser beam; optical constants; thickness measurement; femtosecond lasers; frequency interferometer; material thickness measurement; optical constants; transmission measurements; ultrafast spectral interferometry; ultrafast technique; Beams; Optical interferometry; Optical materials; Optical pulses; Optical receivers; Optical refraction; Pulse measurements; Signal analysis; Thickness measurement; Ultrafast optics;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Lasers and Electro-Optics, 2005. (CLEO). Conference on
  • Print_ISBN
    1-55752-795-4
  • Type

    conf

  • DOI
    10.1109/CLEO.2005.202038
  • Filename
    1573104
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=448170