DocumentCode
448229
Title
Trimming silica planar lightwave circuits using deep ultraviolet ultrafast lasers
Author
Chen, Kevin P. ; Chen, Qiying ; Buric, Michael ; Nikumb, Suwas
Author_Institution
Dept. of Electr. Eng., Pittsburgh Univ., PA, USA
Volume
2
fYear
2005
fDate
22-27 May 2005
Firstpage
1291
Abstract
Trimming phase and birefringence errors in hydrogen-free Mach-Zehnder planar waveguide circuits have been demonstrated with a deep ultraviolet femtosecond laser (258nm, 150fs) achieving refractive index change of gt;3.8×10-4 and complete compensation of the intrinsic birefringence.
Keywords
birefringence; high-speed optical techniques; laser beam machining; laser beams; optical planar waveguides; refractive index; silicon compounds; ultraviolet sources; birefringence errors; deep ultraviolet ultrafast lasers; femtosecond laser; hydrogen-free Mach-Zehnder planar waveguide circuits; refractive index; silica planar lightwave circuits; trimming phase; Birefringence; Circuits; Laser transitions; Optical pulses; Optical waveguides; Pulse amplifiers; Refractive index; Silicon compounds; Ultrafast optics; Waveguide lasers;
fLanguage
English
Publisher
ieee
Conference_Titel
Lasers and Electro-Optics, 2005. (CLEO). Conference on
Print_ISBN
1-55752-795-4
Type
conf
DOI
10.1109/CLEO.2005.202102
Filename
1573168
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