DocumentCode
448242
Title
3D Analysis of scattering losses due to sidewall roughness in microphotonic waveguides: high index-contrast
Author
Barwicz, Tymon
Author_Institution
Res. Lab. of Electron., Massachusetts Inst. of Technol., Cambridge, MA, USA
Volume
2
fYear
2005
fDate
22-27 May 2005
Firstpage
1333
Abstract
We present a 3D analysis of scattering losses due to sidewall roughness in rectangular dielectric waveguides valid for any refractive-index-contrast and field polarization. We show that the typical 2D analyses can substantially over-estimate scattering losses.
Keywords
micro-optics; optical losses; optical waveguides; rectangular waveguides; surface roughness; field polarization; microphotonic waveguides; rectangular dielectric waveguides; refractive-index-contrast; scattering losses; sidewall roughness; Dielectric losses; Green´s function methods; Integrated optics; Optical losses; Optical refraction; Optical scattering; Optical waveguides; Planar waveguides; Polarization; Rectangular waveguides;
fLanguage
English
Publisher
ieee
Conference_Titel
Lasers and Electro-Optics, 2005. (CLEO). Conference on
Print_ISBN
1-55752-795-4
Type
conf
DOI
10.1109/CLEO.2005.202116
Filename
1573182
Link To Document