DocumentCode
448248
Title
Combination of AFM with IR-ATR spectroscopy for measurements in liquid environment
Author
Brucherseifer, Martin ; Kranz, Christine ; Mizaikoff, Boris
Author_Institution
Georgia Inst. of Technol., Atlanta, GA, USA
Volume
2
fYear
2005
fDate
22-27 May 2005
Firstpage
1360
Abstract
We present the instrumental combination of atomic force microscopy with infrared attenuated total reflectance spectroscopy. This is the first time to demonstrate AFM scanning while recording IR-spectra in a liquid environment.
Keywords
atomic force microscopy; attenuated total reflection; infrared spectra; liquid structure; AFM; IR-ATR spectroscopy; IR-spectra; atomic force microscopy; infrared attenuated total reflectance spectroscopy; instrumental combination; liquid environment; Atomic force microscopy; Atomic measurements; Force measurement; Infrared spectra; Optical attenuators; Optical microscopy; Optical reflection; Optical sensors; Optical surface waves; Spectroscopy;
fLanguage
English
Publisher
ieee
Conference_Titel
Lasers and Electro-Optics, 2005. (CLEO). Conference on
Print_ISBN
1-55752-795-4
Type
conf
DOI
10.1109/CLEO.2005.202125
Filename
1573191
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