Title :
An electrical machine testing system on embedded system
Author :
Liu, Yukun ; Li, Yinghui ; Guo, Liwei ; Sun, Xiaoyun
Author_Institution :
Coll. of Electr. & Inf. Sci., Hebei Univ. of Sci. & Technol., China
Abstract :
In this paper, an electrical machine testing system based on embedded system is addressed. C8051F015 is chosen as the microcontroller of this system, and its faster and multi-channel ADC subsystem can meet the real-time, in-situation, and multi-function electrical machine testing needs. μC/OS- II is the real time operating system kernel, which can be planted into this testing system as an operating system kernel. However, an ADC module should de designed and added into this kernel in order to make the testing system as a reliable, portable, small-sized, inexpensive, convenient and customized electrical machine testing system.
Keywords :
electric machine analysis computing; embedded systems; machine testing; microcontrollers; μC/OS- II; C8051F015; electrical machine testing system; embedded system; microcontroller; multichannel ADC subsystem; real time operating system kernel; Automatic testing; Circuit testing; Electronics packaging; Embedded system; Integrated circuit testing; Kernel; Operating systems; Real time systems; System testing; Voltage; ADC module; C8051F015; Electrical machine test; Embedded system; Real time;
Conference_Titel :
Electrical Machines and Systems, 2005. ICEMS 2005. Proceedings of the Eighth International Conference on
Print_ISBN :
7-5062-7407-8
DOI :
10.1109/ICEMS.2005.202483
