• DocumentCode
    448533
  • Title

    An electrical machine testing system on embedded system

  • Author

    Liu, Yukun ; Li, Yinghui ; Guo, Liwei ; Sun, Xiaoyun

  • Author_Institution
    Coll. of Electr. & Inf. Sci., Hebei Univ. of Sci. & Technol., China
  • Volume
    1
  • fYear
    2005
  • fDate
    27-29 Sept. 2005
  • Firstpage
    57
  • Abstract
    In this paper, an electrical machine testing system based on embedded system is addressed. C8051F015 is chosen as the microcontroller of this system, and its faster and multi-channel ADC subsystem can meet the real-time, in-situation, and multi-function electrical machine testing needs. μC/OS- II is the real time operating system kernel, which can be planted into this testing system as an operating system kernel. However, an ADC module should de designed and added into this kernel in order to make the testing system as a reliable, portable, small-sized, inexpensive, convenient and customized electrical machine testing system.
  • Keywords
    electric machine analysis computing; embedded systems; machine testing; microcontrollers; μC/OS- II; C8051F015; electrical machine testing system; embedded system; microcontroller; multichannel ADC subsystem; real time operating system kernel; Automatic testing; Circuit testing; Electronics packaging; Embedded system; Integrated circuit testing; Kernel; Operating systems; Real time systems; System testing; Voltage; ADC module; C8051F015; Electrical machine test; Embedded system; Real time;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Machines and Systems, 2005. ICEMS 2005. Proceedings of the Eighth International Conference on
  • Print_ISBN
    7-5062-7407-8
  • Type

    conf

  • DOI
    10.1109/ICEMS.2005.202483
  • Filename
    1574716