Title :
Experimental investigation of pattern-dependent phase fluctuation in wavelength conversion and XOR operation using semiconductor optical amplifiers
Author :
Kang, I. ; Dorrer, C. ; Zhang, L. ; Rasras, M. ; Bhardwaj, A. ; Buhl, L. ; Cabot, S. ; Dinu, M. ; Cappuzzo, M. ; Gomez, L. ; Wong-Foy, A. ; Chen, Y.F. ; Neilson, D.T. ; Patel, S. ; Jaques, J.
Author_Institution :
Bell Labs., Holmdel, NJ, USA
Abstract :
We measure the phase dynamics and statistics of SOA-based wavelength conversion and XOR operation using linear optical sampling. We elucidate the role of the pattern dependent phase fluctuation in limiting the performance of XOR operation.
Keywords :
Mach-Zehnder interferometers; fluctuations; optical communication equipment; optical delay lines; optical logic; optical wavelength conversion; semiconductor device measurement; semiconductor optical amplifiers; SOA; XOR operation; linear optical sampling; pattern-dependent phase fluctuation; semiconductor optical amplifiers; wavelength conversion;
Conference_Titel :
Optical Communication, 2005. ECOC 2005. 31st European Conference on
Conference_Location :
IET
Print_ISBN :
0-86341-543-1
