Title :
Optical retiming for jitter measurement calibration
Author :
Van Tuyl, Rory ; Ingram, Donald ; Humphreys, David ; Taylor, David
Author_Institution :
Agilent Technol., Palo Alto, CA, USA
Abstract :
Intrinsic noise of optical jitter measuring receivers can be characterized by using a jitter-free optical calibration pattern. We report a method for producing a 10Gb/s NRZ optical calibration pattern with measured pk-pk jitter <5mUl.
Keywords :
calibration; optical noise; optical receivers; timing jitter; 10 Gbits/s; NRZ optical calibration pattern; intrinsic noise; optical jitter measuring receiver; optical retiming; pk-pk jitter;
Conference_Titel :
Optical Communication, 2005. ECOC 2005. 31st European Conference on
Conference_Location :
IET
Print_ISBN :
0-86341-543-1
