DocumentCode
450392
Title
SCOAP: Sandia Controllability/Observability Analysis Program
Author
Goldstein, Lawrence H. ; Thigpen, Evelyn L.
Author_Institution
Sandia National Laboratories, Albuquerque, NM
fYear
1980
fDate
23-25 June 1980
Firstpage
190
Lastpage
196
Abstract
SCOAP is a program developed at Sandia National Laboratories for the analysis of digital circuit testability. Testability is related to the difficulty of controlling and observing the logical values of internal nodes from circuit inputs and outputs, respectively. This paper reviews the testability analysis algorithms and describes their implementation in the SCOAP program.
Keywords
Algorithm design and analysis; Circuit faults; Circuit testing; Controllability; Costs; Design for testability; Digital circuits; Laboratories; Logic testing; Observability;
fLanguage
English
Publisher
ieee
Conference_Titel
Design Automation, 1980. 17th Conference on
Print_ISBN
0-89791-020-6
Type
conf
DOI
10.1109/DAC.1980.1585245
Filename
1585245
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