Title :
SIDS - A Symbolic Interactive Design System
Author :
Clary, D. ; Kirk, R. ; Sapiro, S.
Author_Institution :
American Microsystems, Inc., Santa Clara, CA
Abstract :
A new production approach to IC mask layout/checking is described which makes use of a combination of symbolic layout, computer checking and color graphics to resolve some of the problems in currently available layout systems. Techniques such as on-line design rule and connectivity checking, not found in other production systems, give the user "instant" feedback as he is designing.
Keywords :
Cathode ray tubes; Computer displays; Computer graphics; Error correction; Feedback; Integrated circuit layout; Kirk field collapse effect; MOS integrated circuits; Permission; Production systems;
Conference_Titel :
Design Automation, 1980. 17th Conference on
Print_ISBN :
0-89791-020-6
DOI :
10.1109/DAC.1980.1585258
