Title :
High-Speed Concurrent Fault Simulation with Vectors and Scalars
Author :
Ulrich, E. ; Lacy, D. ; Phillips, N. ; Tellier, J. ; Kearney, M. ; Elkind, T. ; Beaven, R.
Author_Institution :
Digital Equipment Corporation, Maynard, MA
Keywords :
Analytical models; Circuit faults; Circuit simulation; Circuit testing; Discrete event simulation; Integrated circuit interconnections; Logic testing; Permission; Timing; Voting;
Conference_Titel :
Design Automation, 1980. 17th Conference on
Print_ISBN :
0-89791-020-6
DOI :
10.1109/DAC.1980.1585274
