• DocumentCode
    450452
  • Title

    A Fast Signature Simulation Tool for Built-In Self-Testing Circuits

  • Author

    Tan, S.B. ; Totton, K. ; Baker, K. ; Varma, P. ; Porter, R.

  • Author_Institution
    GEC Research Limited, Hirst Research Centre, Wembley, Middlesex, United Kingdom
  • fYear
    1987
  • fDate
    28-1 June 1987
  • Firstpage
    17
  • Lastpage
    25
  • Abstract
    This paper describes a Fast Signature Simulator (FSS) tool for Built-In Self-Testing (BIST) circuits. The FSS consists of a simulator generator and a compiled code simulator. The simulator generator comprises a controlling program called the EXECUTIVE and translation software called SIM-GEN. SIM-GEN accepts a Hardware Description Language (HDL) representation of the circuit-under-test as its input and produces C code simulation modules comprising Boolean relations that represent the structure of the circuit. These C code modules are then compiled and linked together to form the basis of the compiled code simulator. Simulation is invoked by executing the compiled C code description of the circuit. The simulation time is minimised by the use of parallel simulation techniques in conjunction with efficient functional models and novel mapping techniques for the LFSRs. Performances approaching 5 Million Gate Evaluations Per Second (GEPS) have been achieved using the FSS.
  • Keywords
    Automatic testing; Built-in self-test; Circuit simulation; Circuit testing; Computational modeling; Costs; Frequency selective surfaces; Materials testing; Performance evaluation; Very large scale integration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design Automation, 1987. 24th Conference on
  • ISSN
    0738-100X
  • Print_ISBN
    0-8186-0781-5
  • Type

    conf

  • DOI
    10.1109/DAC.1987.203216
  • Filename
    1586200