DocumentCode

450475

Title

Functional Abstraction from Structure in VLSI Simulation Models

Author

Lathrop, R.H. ; Hall, R.J. ; Kirk, R.S.

fYear

1987

fDate

28-1 June 1987

Firstpage

188

Lastpage

188

Keywords

Kirk field collapse effect; Very large scale integration;

fLanguage

English

Publisher

ieee

Conference_Titel

Design Automation, 1987. 24th Conference on

ISSN

0738-100X

Print_ISBN

0-8186-0781-5

Type

conf

DOI

10.1109/DAC.1987.203241

Filename

1586225