DocumentCode :
450533
Title :
Statistics for Parallelism and Abstraction Level in Digital Simulation
Author :
Soulé, Larry ; Blank, Tom
Author_Institution :
Stanford University Center for Integrated Systems
fYear :
1987
fDate :
28-1 June 1987
Firstpage :
588
Lastpage :
591
Abstract :
This paper presents statistics of several designs at four design abstraction levels - the instruction, behavioral, RTL, and gate levels. The data includes simulation time profiles, maximum speedup and limitations of parallelism, typical model evaluation times, event distributions, element intensities, and component counts for the four abstraction levels. This data is then used to analyze and evaluate several speed-up approaches: mixed-level simulation, parallel software simulators, parallel pipelined hardware accelerators, and decreased time resolution. The results show that element activity is around 0.1 to 0.5% at any particular time point. For the example circuits (3400 gates, 5000 gates, and 150,000 transistors), simulations show that parallelism can obtain speed-ups between 10-30. We found a factor of roughly ten speed-up between each of the abstraction levels.
Keywords :
Analytical models; Circuit simulation; Digital simulation; Discrete event simulation; Hardware; Statistics; Switches; Timing; Virtual groups; Wires;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design Automation, 1987. 24th Conference on
ISSN :
0738-100X
Print_ISBN :
0-8186-0781-5
Type :
conf
DOI :
10.1109/DAC.1987.203306
Filename :
1586290
Link To Document :
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