DocumentCode :
45076
Title :
Design of a Nonvolatile 7T1R SRAM Cell for Instant-on Operation
Author :
Wei Wei ; Namba, Kazuteru ; Jie Han ; Lombardi, Floriana
Author_Institution :
Dept. of Electr. & Comput. Eng., Northeastern Univ., Boston, MA, USA
Volume :
13
Issue :
5
fYear :
2014
fDate :
Sept. 2014
Firstpage :
905
Lastpage :
916
Abstract :
Energy consumption is a major concern in nanoscale CMOS ICs; the power-Off operational mode and low-voltage circuits have been proposed to alleviate energy dissipation. Static random access memories (SRAMs) are widely used in today´s chips; nonvolatile SRAMs (NVSRAMs) have been proposed to preserve data, while providing fast power- On/Off speeds. Nonvolatile operation is usually accomplished by the use of a resistive RAM circuit (hence referred to as RRAM); the utilization of a RRAM with an SRAMs not only enables chips to achieve low energy consumption for nonvolatile operation, but it also permits to restore data when a restore on power-up is performed (this operation is also commonly referred to as “Instant-on”). This paper presents a novel NVSRAM circuit for “Instant-on” operation and evaluates its performance at nanometric feature sizes. The proposed memory cell consists of a SRAM core (in this case, a 6T cell) and an oxide resistive RRAM circuit (1T1R), thus making a 7T1R scheme. The proposed cell offers better nonvolatile performance (in terms of operations such as “Store,” “Power-down,” and “Restore”) when compared with existing nonvolatile cells. The scenario of multiple-context configuration is also analyzed. Figures of merit such as energy, operational delay, and area are also substantially improved, making the proposed design a better scheme for “Instant-on” operation.
Keywords :
CMOS integrated circuits; SRAM chips; energy consumption; energy consumption; instant-on operation; low-voltage circuits; nanoscale CMOS IC; nonvolatile 7T1R SRAM cell; operational delay; oxide resistive RRAM circuit; power-OFF operational mode; power-ON-OFF speed; resistive RAM circuit; static random access memories; Integrated circuit modeling; Nonvolatile memory; Random access memory; Resistance; Semiconductor device modeling; Switches; Transistors; HSPICE; leakage reduction; nonvolatile SRAM (NVSRAM); nonvolatile memory; resistive RAM (RRAM); static random access memory (SRAM);
fLanguage :
English
Journal_Title :
Nanotechnology, IEEE Transactions on
Publisher :
ieee
ISSN :
1536-125X
Type :
jour
DOI :
10.1109/TNANO.2014.2329915
Filename :
6828762
Link To Document :
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