• DocumentCode
    450961
  • Title

    Laser simulation of single event effects in electronics

  • Author

    Jones, Roy

  • fYear
    2005
  • fDate
    6-6 Dec. 2005
  • Firstpage
    2
  • Lastpage
    42412
  • Abstract
    A collection of slides from the author´s seminar presentation is given
  • Keywords
    laser beam effects; radiation hardening (electronics); MBDA radiation effects laser system; depth sensitivity; electronics; laser simulation; memory mapping; multiple bit upset; single event effects; threshold mapping; two photon technique;
  • fLanguage
    English
  • Publisher
    iet
  • Conference_Titel
    Cosmic Radiation Single Event Effects and Avionics, 2005. The IEE Seminar on (Ref. No. 2005/11270)
  • Conference_Location
    London
  • ISSN
    0537-9989
  • Print_ISBN
    0-86341-600-4
  • Type

    conf

  • Filename
    1589844
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=450961