DocumentCode :
451408
Title :
2.1 mΩ-cm2, 1.6 kV 4H-Silicon Carbide VJFET for Power Applications
Author :
Veliadis, Victor ; Chen, Li-Shu ; Stewart, Eric ; McCoy, Megan ; McNutt, Ty ; Van Campen, Steve ; Clarke, Chris ; DeSalvo, Gregory
fYear :
2005
fDate :
Dec. 7-9, 2005
Firstpage :
166
Lastpage :
167
Keywords :
Dielectrics; Electrons; Epitaxial layers; Forward contracts; Implants; Packaging; Silicides; Silicon carbide; Testing; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Semiconductor Device Research Symposium, 2005 International
Print_ISBN :
1-4244-0083-X
Type :
conf
DOI :
10.1109/ISDRS.2005.1596034
Filename :
1596034
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=451408