DocumentCode
451608
Title
High-resolution alpha-particle spectrometry using silicon carbide semiconductor detectors
Author
Ruddy, Frank H. ; Seidel, John G. ; Chen, Haoqian ; Dulloo, Abdul R. ; Ryu, Sei-Hyung
Author_Institution
Westinghouse Electr. Corp., Pittsburgh, PA
Volume
3
fYear
2005
fDate
23-29 Oct. 2005
Firstpage
1231
Lastpage
1235
Abstract
SiC detectors with active volume dimensions sufficient to stop alpha particles have been manufactured and tested. A linear energy response and excellent energy resolution have been obtained for various alpha emitters in the 3.18-MeV to 8.38-MeV energy range. Evaluation of the contributing factors to the SiC detector energy resolution indicates that the measured values for the full width at half maximum (FWHM) are limited by energy straggling of the alpha particles as they pass through the metallic contact layers that comprise the entrance window to the detector. Even with this component included in the measured FWHM, the measured values are comparable to those achievable with silicon alpha spectrometers. The possibility that the energy resolution that can be achieved with SiC may surpass that of silicon can not be excluded. SiC alpha spectrometers are expected to be useful in many nuclear applications where the ability to operate in high-temperature and high-radiation environments is required. Such applications include monitoring of alpha particles and neutrons in actinide waste-tank environments as well as neutron and gamma-ray monitoring of spent nuclear fuel assemblies
Keywords
alpha-particle spectrometers; gamma-ray detection; neutron detection; nuclear fuel cycle facilities; radioactive waste processing; silicon radiation detectors; SiC detectors energy resolution; actinide waste-tank environments; alpha emitters; full width at half maximum; gamma-ray monitoring; high-radiation environment; high-resolution alpha-particle spectrometry; high-temperature environment; linear energy response; metallic contact layers; neutron monitoring; nuclear fuel assemblies; silicon alpha spectrometers; silicon carbide semiconductor detectors; Alpha particles; Detectors; Energy measurement; Energy resolution; Monitoring; Neutrons; Semiconductor device manufacture; Silicon carbide; Spectroscopy; Testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Nuclear Science Symposium Conference Record, 2005 IEEE
Conference_Location
Fajardo
ISSN
1095-7863
Print_ISBN
0-7803-9221-3
Type
conf
DOI
10.1109/NSSMIC.2005.1596541
Filename
1596541
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