Title :
High-resolution alpha-particle spectrometry using silicon carbide semiconductor detectors
Author :
Ruddy, Frank H. ; Seidel, John G. ; Chen, Haoqian ; Dulloo, Abdul R. ; Ryu, Sei-Hyung
Author_Institution :
Westinghouse Electr. Corp., Pittsburgh, PA
Abstract :
SiC detectors with active volume dimensions sufficient to stop alpha particles have been manufactured and tested. A linear energy response and excellent energy resolution have been obtained for various alpha emitters in the 3.18-MeV to 8.38-MeV energy range. Evaluation of the contributing factors to the SiC detector energy resolution indicates that the measured values for the full width at half maximum (FWHM) are limited by energy straggling of the alpha particles as they pass through the metallic contact layers that comprise the entrance window to the detector. Even with this component included in the measured FWHM, the measured values are comparable to those achievable with silicon alpha spectrometers. The possibility that the energy resolution that can be achieved with SiC may surpass that of silicon can not be excluded. SiC alpha spectrometers are expected to be useful in many nuclear applications where the ability to operate in high-temperature and high-radiation environments is required. Such applications include monitoring of alpha particles and neutrons in actinide waste-tank environments as well as neutron and gamma-ray monitoring of spent nuclear fuel assemblies
Keywords :
alpha-particle spectrometers; gamma-ray detection; neutron detection; nuclear fuel cycle facilities; radioactive waste processing; silicon radiation detectors; SiC detectors energy resolution; actinide waste-tank environments; alpha emitters; full width at half maximum; gamma-ray monitoring; high-radiation environment; high-resolution alpha-particle spectrometry; high-temperature environment; linear energy response; metallic contact layers; neutron monitoring; nuclear fuel assemblies; silicon alpha spectrometers; silicon carbide semiconductor detectors; Alpha particles; Detectors; Energy measurement; Energy resolution; Monitoring; Neutrons; Semiconductor device manufacture; Silicon carbide; Spectroscopy; Testing;
Conference_Titel :
Nuclear Science Symposium Conference Record, 2005 IEEE
Conference_Location :
Fajardo
Print_ISBN :
0-7803-9221-3
DOI :
10.1109/NSSMIC.2005.1596541