Title :
Development of one-dimensional microstrip gas counter with cathode encoding method
Author :
Niko, Hisako ; Fujita, Kaoru ; Takahashi, Hiroyuki ; Siritiprussamee, Prasit ; Nakazawa, Masaharu ; Furusaka, Michihiro ; Ino, Takashi ; Kishimoto, Synji
Author_Institution :
Graduate Sch. of Eng., Tokyo Univ., Japan
Abstract :
Recently intensive development of position sensitive neutron detectors for next-generation spallation neutron sources is demanded. Gaseous detectors are considered as reasonable position-sensitive neutron detectors for neutron spectrometers. A charge division method is often used for position-sensitive neutron proportional counters, and it can simplify detector front-end electronics and save the number of interconnections through high-pressure gas chamber. We are trying to develop a new type of one-dimensional micro-strip gas counter (1-D MSGC) which can avoid distortion of images by modifying cathode geometry. We use both signals from anode for coarse position information and cathode for fine position information. We made a test plate and this show adequate result that each fine (1 mm) pitch cathode pads could be observed individually in its phase difference as we had neutron beam scanned along the anode strip by 0.5 mm step under the operation at 3He (0.3 atm) and CF4 (3 atm) . As the next step, we developed a new prototype plate with about 300 mm of sensitive length. We checked its basic performance and had it tested with neutron beam.
Keywords :
helium-3 counters; neutron detection; position sensitive particle detectors; 0.3 atm; 0.5 mm; 1 mm; 3 atm; 3He gas; CF4 gas; cathode encoding method; charge division method; detector front-end electronics; fine pitch cathode pads; high-pressure gas chamber; neutron spectrometers; next-generation spallation neutron sources; one-dimensional microstrip gas counter; position-sensitive neutron proportional counters; Anodes; Cathodes; Counting circuits; Encoding; Microstrip; Neutrons; Particle beams; Position sensitive particle detectors; Spectroscopy; Testing;
Conference_Titel :
Nuclear Science Symposium Conference Record, 2005 IEEE
Print_ISBN :
0-7803-9221-3
DOI :
10.1109/NSSMIC.2005.1596546