Title :
Preliminary results of large volume multi-pair coplanar grid CdZnTe detector fabrication
Author :
Gostilo, V. ; He, Z. ; Ivanov, V. ; Li, L. ; Loupilov, A. ; Tsirkounova, I.
Author_Institution :
Baltic Sci. Instrum., Riga, Latvia
Abstract :
We present electrode fabrication techniques and preliminary test results of a multi-pair coplanar grid CdZnTe detector with a volume of 11 cm3, the largest single CdZnTe device ever fabricated. The crystal of initial dimensions 30.5×32.9×17.3 mm3 was grown by modified vertical Bridgman technique. The peculiarities of the growing process are analyzed. Crystal has high bulk resistivity of ρ = 1 × 1011 ohm-cm, a value of (μτ)e = 5.6×10-3 cm2/V and a value of electron mobility μe = 675 cm2/Vs. Non-uniformity of material was found as result of crystal input test. Intergrid resistivity on all four segments of electrode structure was about 0.4 Gohm and 0.2 Gohm on Cd and Te side respectively. These values are significantly lower than that in our previous development. Dependences of resistivity on technological modes of passivation and on applied voltage are presented. Leakage current in all segments of detector did not exceed 10 nA at bias 1200 V. Spectra Cs-137 for all four segments of detector structure are presented.
Keywords :
II-VI semiconductors; cadmium compounds; crystal growth from melt; electrical resistivity; electron mobility; leakage currents; passivation; semiconductor counters; wide band gap semiconductors; zinc compounds; 1200 V; 17.3 mm; 30.5 mm; 32.9 mm; CdZnTe; Cs-137 spectra; bulk resistivity; electrode fabrication techniques; electron mobility; intergrid resistivity; large volume multi-pair coplanar grid CdZnTe detector fabrication; leakage current; modified vertical Bridgman technique; passivation; Conductivity; Crystalline materials; Detectors; Electrodes; Electron mobility; Fabrication; Leak detection; Materials testing; Passivation; Tellurium;
Conference_Titel :
Nuclear Science Symposium Conference Record, 2005 IEEE
Print_ISBN :
0-7803-9221-3
DOI :
10.1109/NSSMIC.2005.1596582