• DocumentCode
    451802
  • Title

    An advanced analytic method incorporating the geometrical properties of scanner and radiation emissions into the system model for the true component of 3D PET data

  • Author

    Markiewicz, P.J. ; Reader, A.J. ; Tamal, M. ; Julyan, P.J. ; Hastings, D.L.

  • Author_Institution
    Sch. of Chem. Eng. & Anal. Sci., Manchester Univ., UK
  • Volume
    4
  • fYear
    2005
  • fDate
    23-29 Oct. 2005
  • Firstpage
    2310
  • Lastpage
    2314
  • Abstract
    An approach to an analytic system model for the true component of 3D PET data offering the accuracy of a Monte Carlo model run for an infinite time is presented. The system model, which is used in the expectation maximisation (EM) algorithm, accounts for the 3D nature of the emission process in which the geometric sensitivity to a point source varies along and across the tube of each line of response (LOR). Therefore the system model cannot be based just on line or tube integrals as it is for the model of transmission scanning. By accounting for the varying sensitivity within each LOR in the reconstruction process unbiased and quantitatively exact images can be achieved without using calibration or scaling factors after the reconstruction process. Two approaches to the model are investigated, i.e., LOR- and voxel-driven which are validated using high statistics Monte Carlo simulation (SimSET).
  • Keywords
    Monte Carlo methods; expectation-maximisation algorithm; image reconstruction; medical image processing; positron emission tomography; 3D PET data; expectation maximisation algorithm; high statistics Monte Carlo simulation; image reconstruction; line-of-response; radiation emission; scanner geometrical properties; Attenuation; Calibration; Detectors; Event detection; Face detection; Image reconstruction; Matrix decomposition; Monte Carlo methods; Positron emission tomography; Solid modeling;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nuclear Science Symposium Conference Record, 2005 IEEE
  • ISSN
    1095-7863
  • Print_ISBN
    0-7803-9221-3
  • Type

    conf

  • DOI
    10.1109/NSSMIC.2005.1596796
  • Filename
    1596796