Title :
Analysis and Reliable Design of ECL Circuits with Distributed RLC Interconnections
Author :
Haque, Monjurul ; Chowdhury, S.
Author_Institution :
Department of Electrical and Computer Engineering, The University of Iowa, Iowa City, IA
Abstract :
An analytical study of the transient response of ECL gates with lossy transmission line interconnections is presented. Closed-form equations for delay, rise time, overshoot, undershoot, and maximum transient current are derived using linearized interface models and rational function approximations to the s-domain equations. The equations have been shown to be accurate within a few percent of SPICE estimates.
Keywords :
Delay effects; Distributed parameter circuits; Equations; Function approximation; Integrated circuit interconnections; Power system transients; Propagation losses; RLC circuits; SPICE; Transient response;
Conference_Titel :
Design Automation, 1993. 30th Conference on
Print_ISBN :
0-89791-577-1
DOI :
10.1109/DAC.1993.204035
