Title :
Path Hashing to Accelerate Delay Fault Simulation
Author :
Henftling, Manfred ; Wittmann, Hannes C. ; Antreich, Kurt J.
Author_Institution :
Institute of Electronic Design Automation, Department of Electrical Engineering, Technical University of Munich, Munich, Germany
Abstract :
This paper presents an efficientapproach to path delay fault simulation. We accelerate fault simulation by more than one order of magnitude with a new speed up technique called path hashing. An intelligent path identification method allows to deal with circuits containing two orders of magnitude more paths than state-of-the-art tools. Using these techniques larger circuits can be handled with a reasonable amount of time and memory.
Keywords :
Acceleration; Circuit faults; Circuit simulation; Circuit testing; Combinational circuits; Delay; Fault detection; Logic; Manufacturing processes; Semiconductor device modeling;
Conference_Titel :
Design Automation, 1994. 31st Conference on
Print_ISBN :
0-89791-653-0
DOI :
10.1109/DAC.1994.204158