Title :
320 Gb/s All-Optical Eye Diagram Sampling using Gain-Transparent Ultrafast-Nonlinear Interferometer (GT-UNI)
Author :
Schmidt, C. ; Schubert, C. ; Watanabe, S. ; Futami, F. ; Ludwig, R. ; Weber, H.G.
Author_Institution :
Heinrich-Hertz-Inst. fur Nachrichtentech. Berlin GmbH
Abstract :
A semiconductor based all-optical sampling system is demonstrated for the first time to measure a 320 Gb/s optical eye diagram. The system incorporates a gain-transparent ultrafast-nonlinear interferometer as sampling gate
Keywords :
high-speed optical techniques; light interferometers; optical communication equipment; optical fibre communication; 320 Gbit/s; all-optical eye diagram sampling; gain-transparent ultrafast-nonlinear interferometer; sampling gate;
Conference_Titel :
Optical Communication, 2002. ECOC 2002. 28th European Conference on
Conference_Location :
Copenhagen
Print_ISBN :
87-90974-63-8
