DocumentCode
452220
Title
Characterization of In-Plane Resonant Cavities with Photonic Crystal Boundaries Etched in InP-Based Heterostructure
Author
Mulot, M. ; Qiu, M. ; Swillo, M. ; Anand, S. ; Jaskorzynska, B. ; Talneau, A.
Author_Institution
Dept. of Microelectron. & Inf. Technol., R. Inst. of Technol., Kista
Volume
2
fYear
2002
fDate
8-12 Sept. 2002
Firstpage
1
Lastpage
2
Abstract
In-plane cavities with photonic crystal boundaries are realized in InP/InGaAsP/InP slab waveguides. A quality factor of 400 for a 6 mum long cavity with 6-hole mirrors is measured. The quality of the photonic crystals are investigated by fitting transmission spectra with 2D finite-difference time-domain simulations
Keywords
III-V semiconductors; Q-factor; etching; finite difference time-domain analysis; gallium arsenide; indium compounds; mirrors; optical waveguides; photonic crystals; 2D finite-difference time-domain simulations; InP-InGaAsP-InP; InP/InGaAsP/InP slab waveguides; etching; photonic crystal; photonic crystals; quality factor; resonant cavities; transmission spectra;
fLanguage
English
Publisher
ieee
Conference_Titel
Optical Communication, 2002. ECOC 2002. 28th European Conference on
Conference_Location
Copenhagen
Print_ISBN
87-90974-63-8
Type
conf
Filename
1601010
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