Title :
Characterization of In-Plane Resonant Cavities with Photonic Crystal Boundaries Etched in InP-Based Heterostructure
Author :
Mulot, M. ; Qiu, M. ; Swillo, M. ; Anand, S. ; Jaskorzynska, B. ; Talneau, A.
Author_Institution :
Dept. of Microelectron. & Inf. Technol., R. Inst. of Technol., Kista
Abstract :
In-plane cavities with photonic crystal boundaries are realized in InP/InGaAsP/InP slab waveguides. A quality factor of 400 for a 6 mum long cavity with 6-hole mirrors is measured. The quality of the photonic crystals are investigated by fitting transmission spectra with 2D finite-difference time-domain simulations
Keywords :
III-V semiconductors; Q-factor; etching; finite difference time-domain analysis; gallium arsenide; indium compounds; mirrors; optical waveguides; photonic crystals; 2D finite-difference time-domain simulations; InP-InGaAsP-InP; InP/InGaAsP/InP slab waveguides; etching; photonic crystal; photonic crystals; quality factor; resonant cavities; transmission spectra;
Conference_Titel :
Optical Communication, 2002. ECOC 2002. 28th European Conference on
Conference_Location :
Copenhagen
Print_ISBN :
87-90974-63-8
