Title :
Embedded Test Resource to Reduce the Required Memory and Channels of Tester
Author :
Han, Yinhe ; Hu, Yu ; Li, Huawei ; Li, Xiaowei
Author_Institution :
Inst. of Comput. Technol., Chinese Acad. of Sci., Beijing
Abstract :
An embedded test stimulus decompressor is presented to generate the test patterns, which can reduce the required vector memory and channels of automatic test equipment (ATE). The decompressor consists of a periodically alterable MUX network which has multiple configurations to decode the input information flexibly. A complete synthesis flow is presented to generate the MUXs network automatically. With the dedicated efforts, the low-cost ATE with low data bandwidth can be used to test the system-on-a-chip with high complexity
Keywords :
automatic test equipment; automatic test pattern generation; embedded systems; integrated circuit testing; microprocessor chips; system-on-chip; MUX network; automatic test equipment; embedded test resource; embedded test stimulus decompressor; required vector memory reduction; system-on-a-chip testing; test pattern generation; tester channels; Automatic testing; Bandwidth; Circuit testing; Computers; Costs; Decoding; Genetic mutations; Pins; System testing; System-on-a-chip; Automatic Test Equipment; MUXs Network; Test Stimulus Decompressor;
Conference_Titel :
Instrumentation and Measurement Technology Conference, 2005. IMTC 2005. Proceedings of the IEEE
Conference_Location :
Ottawa, Ont.
Print_ISBN :
0-7803-8879-8
DOI :
10.1109/IMTC.2005.1604097
