System for the testing of high-resolution ADCs at frequency of 1 MHz

Author

Haasz, Vladimír ; Slepicka, David ; Komárek, Milan ; Roztocil, J.

Author_Institution

Dept. of Meas., Czech Tech. Univ., Prague

Volume

1

fYear

2005

fDate

16-19 May 2005

Firstpage

278

Lastpage

281

Abstract

A system for the testing of ADCs at the frequency range of 1 MHz was designed and prototyped at the Dept. of Measurement, CTU FEE. Two methods were applied to suppress the influence of signal distortion: 1) filtering by special high-quality filters with a near-linear transfer characteristic; 2) filtering by low-cost filters and the application of following numerical correction of residual distortion. Low-cost as well as high-quality filters were manufactured. Experimental results showed that the method is directly applicable for the testing of ADCs with the ENOB up to 14 in case of low-cost filters and up to 20 in case of high-quality filters. An extension of the method for the testing of ADCs with hither ENOB can bring an application of the frequency spectrum correction method

Keywords

analogue-digital conversion; distortion; filters; test equipment; 1 MHz; ADC testing; frequency spectrum correction; high-quality filters; high-resolution ADC; low-cost filters; near-linear transfer characteristic; signal distortion; signal filtering; test signal; Band pass filters; Coils; Distortion measurement; Electric variables measurement; Filtering; Frequency measurement; Power harmonic filters; Resonator filters; Signal generators; System testing; ADC testing; frequency spectrum correction; signal filtering; test signal;

fLanguage

English

Publisher

ieee

Conference_Titel

Instrumentation and Measurement Technology Conference, 2005. IMTC 2005. Proceedings of the IEEE

Conference_Location

Ottawa, Ont.

Print_ISBN

0-7803-8879-8

Type

conf

DOI

10.1109/IMTC.2005.1604117

Filename

1604117