Title :
Hebbian Learning Based Image Reconstruction for Positron Emission Tomography
Author :
Mondal, Partha P. ; Kanhirodan, Rajan
Author_Institution :
Dept. of Phys., Indian Inst. of Sci., Bangalore
Abstract :
Maximum a-posteriori (MAP) algorithms eliminates noisy artifacts by utilizing available prior information in the reconstruction process. The MAP based algorithms fail to determine the density class in the reconstructed image and hence penalize the pixels irrespective of the density class and irrespective of interaction between the nearest neighbors. In this paper, Hebbian neural learning scheme is proposed to model the nature of inter-pixel interaction in order to reconstruct artifact-free edge-preserving reconstruction. It is assumed that local correlation plays a significant role in the image reconstruction process and proper modeling of correlation weight (which defines the strength of inter-pixel interaction) is essential for generating artifact free reconstruction. Quantitative analysis shows that the proposed scheme based reconstruction algorithm is capable of producing better reconstructed images. The reconstructed images are sharper with small features being better resolved
Keywords :
Hebbian learning; image reconstruction; maximum likelihood estimation; medical image processing; neural nets; positron emission tomography; Hebbian learning; Hebbian neural learning scheme; MAP algorithms; artifact-free reconstruction; edge-preserving reconstruction; image reconstruction; inter-pixel interaction; maximum a-posteriori algorithms; positron emission tomography; Algorithm design and analysis; Hebbian theory; Image analysis; Image reconstruction; Image resolution; Maximum a posteriori estimation; Nearest neighbor searches; Pixel; Positron emission tomography; Reconstruction algorithms; Image Reconstruction; Maximum A - posteriori Estimation Hebbian Learning Positron Emission Tomography; Maximum Likelihood;
Conference_Titel :
Instrumentation and Measurement Technology Conference, 2005. IMTC 2005. Proceedings of the IEEE
Conference_Location :
Ottawa, Ont.
Print_ISBN :
0-7803-8879-8
DOI :
10.1109/IMTC.2005.1604391