DocumentCode :
453111
Title :
Capacitance extraction of on-chip circular stacked inductors
Author :
Liu, Xiaocha ; Lin, Liang ; Yin, Wen-Yan ; Mao, Junfa
Author_Institution :
Sch. of Electron. Inf. & Electr. Eng., Shanghai Jiao Tong Univ., China
Volume :
2
fYear :
2005
fDate :
4-7 Dec. 2005
Abstract :
In this paper, we proposed a method to characterize the capacitive coupling effects in circular stacked inductors, which takes the non-overlapping between upper and bottom traces of different layers into account. Compared with the full-wave method and the analytical method with completely overlapping assumption, our method can predict self-resonant frequency (fSR) for on-chip circular stacked inductors used in RFICs more accurately.
Keywords :
capacitance measurement; inductors; radiofrequency integrated circuits; capacitance extraction; capacitive coupling effects; on-chip circular stacked inductors; radiofrequency integrated circuit; self-resonant frequency; Capacitance; Clocks; Data mining; Frequency; Inductance; Inductors; Partial response channels; Q factor; Radiofrequency integrated circuits; Strontium;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave Conference Proceedings, 2005. APMC 2005. Asia-Pacific Conference Proceedings
Print_ISBN :
0-7803-9433-X
Type :
conf
DOI :
10.1109/APMC.2005.1606439
Filename :
1606439
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=453111
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