DocumentCode :
453231
Title :
Application of bilinear quadrilateral modeling to EM scattering problems
Author :
Geng, Fangzhi ; Tong, Chuangming ; Lv, Dan ; Xia, Dongyu ; Wang, Guangming
Author_Institution :
Missile Inst., AFEU, Xi´´an, China
Volume :
3
fYear :
2005
fDate :
4-7 Dec. 2005
Abstract :
The geometry construction of complex objects needs to be firstly considered when calculating the electromagnetic (EM) scattering with integration equation method. It is the base of the EM analysis, determining the accuracy and the time consuming directly. The objects should be set up and be meshed according to some rule before EM analysis. This paper recommends some rules about the surface modeling of the perfect electric conductor (PEC), builds some complex objects through bilinear quadrilateral, and gives the calculation formulas associating with the physical optics (PO) on radar cross section (RCS). The final results indicate that this method is accurate and efficient.
Keywords :
computational geometry; electromagnetic wave scattering; integral equations; mesh generation; physical optics; radar cross-sections; solid modelling; bilinear quadrilateral modeling; electromagnetic scattering; integration equation; perfect electric conductor; physical optics; radar cross section; surface modeling; Conductors; Electromagnetic scattering; Equations; Geometry; Mathematical model; Missiles; Optical scattering; Radar scattering; Roentgenium; Solid modeling;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave Conference Proceedings, 2005. APMC 2005. Asia-Pacific Conference Proceedings
Print_ISBN :
0-7803-9433-X
Type :
conf
DOI :
10.1109/APMC.2005.1606632
Filename :
1606632
Link To Document :
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