Reflection phase characteristics of plane wave oblique incidence on the mushroom-like electromagnetic band-gap structures

Mushroom-like electromagnetic band-gap (EBG) structures exhibit unique electromagnetic properties that have led to a wide range of applications in the antenna and propagation fields. This paper focuses on the reflection phase characteristics of plane waves oblique incidence on the EBG surfaces. It is shown that the reflection phase of an EBG structure depends on the incident angle and polarization of plane waves. A novel phenomenon of the double in-phase reflection when the TM polarization plane wave obliquely illuminates the EBG structure is revealed and validated by theoretical simulations and experiments.