DocumentCode :
45329
Title :
Performance of Electro-Thermally Driven {\\rm VO}_{2} -Based MEMS Actuators
Author :
Cabrera, Rafmag ; Merced, Emmanuelle ; Sepulveda, Nelson
Author_Institution :
Dept. of Electr. & Comput. Eng., Michigan State Univ., East Lansing, MI, USA
Volume :
23
Issue :
1
fYear :
2014
fDate :
Feb. 2014
Firstpage :
243
Lastpage :
251
Abstract :
The integration of VO2 thin films in a MEMS actuator device is presented. The structural phase transition of VO2 was induced electro-thermally by resistive heaters monolithically integrated in the MEMS actuator. The drastic mechanical displacements generated by the large stress induced during the VO2 thin film phase transition have been characterized for static and time-dependent current pulses to the resistive heater, for air and vacuum environments. A comprehensive and simplified finite element model is developed and validated with experimental data. It was found that the cut-off frequency of the 300 μm-long VO2-based MEMS actuator operated in vacuum (f3dB=29 Hz) was mostly limited by conductive heat loss through the anchor, whereas convection losses were more dominant in air (f3dB=541 Hz). The cut-off frequency is found to be strongly dependent on the dimensions of the cantilever when operated in air but far less dependent when operated in vacuum. Total deflections of 68.7 and 28.5 μm were observed for 300 and 200 μm-long MEMS cantilevers, respectively. Full actuation in air required ~ 16 times more power than in vacuum.
Keywords :
finite element analysis; microactuators; phase transformations; vanadium compounds; MEMS actuator device; VO2; conductive heat loss; drastic mechanical displacements; electrothermally driven MEMS actuators; finite element model; frequency 29 Hz; resistive heaters; size 200 mum; size 300 mum; structural phase transition; thin film phase transition; time dependent current pulses; Actuators; Atmospheric modeling; Crystals; Finite element analysis; Heating; Micromechanical devices; Thermal expansion; MEMS actuators; actuator dynamics; phase transition; vanadium dioxide;
fLanguage :
English
Journal_Title :
Microelectromechanical Systems, Journal of
Publisher :
ieee
ISSN :
1057-7157
Type :
jour
DOI :
10.1109/JMEMS.2013.2271774
Filename :
6560383
Link To Document :
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