DocumentCode :
453344
Title :
The RSFQ test-timing model for delay insensitive data processing pipeline design
Author :
Zhang, Zhong-hai ; Guan, Bo-Ran
Author_Institution :
Sch. of Electron. Eng., Xidian Univ., Xi´´an, China
Volume :
4
fYear :
2005
fDate :
4-7 Dec. 2005
Abstract :
A novel asynchronous RSFQ digital circuit model, test-timed RSFQ digital model (TT) is proposed in this paper. With this asynchronous approach, data is transferred in a delay-insensitive fashion to avoid the problems aroused from the global clock distribution and the timing uncertainty. In the TT model, the timing pulse to the logic module will be generated with a test logic module, instead of the time delay module, which should be necessary in most asynchronous circuits. The elimination of the delay module can basically solve the timing uncertainty bothered in the RSFQ digital system layouts. The transient simulations and logic simulations have been made for the OR module and a RSFQ data processing pipeline based on the TT scheme has been designed. The logic simulations have also been made for this pipeline, and the results showed its feasibility and satisfaction for the RSFQ digital system applications.
Keywords :
asynchronous circuits; integrated circuit modelling; logic design; logic testing; pipeline processing; RSFQ digital system layouts; RSFQ test-timing model; asynchronous RSFQ digital circuit model; delay insensitive data processing pipeline design; global clock distribution; logic module; logic simulations; test-timed RSFQ digital model; time delay module; timing pulse; timing uncertainty; transient simulations; Circuit simulation; Circuit testing; Data processing; Delay; Logic circuits; Logic testing; Pipelines; Process design; Timing; Uncertainty;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave Conference Proceedings, 2005. APMC 2005. Asia-Pacific Conference Proceedings
Print_ISBN :
0-7803-9433-X
Type :
conf
DOI :
10.1109/APMC.2005.1606813
Filename :
1606813
Link To Document :
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