DocumentCode :
453416
Title :
Improvement of differential planar spiral inductors on a 0.35μm BiCMOS process
Author :
Steinmair, A. ; Mayer, M.L. ; Molnar, K. ; Ribic, N. ; Huszka, Z. ; Seebacher, E. ; Magerl, G.
Volume :
1
fYear :
2005
fDate :
4-6 Oct. 2005
Abstract :
An improved structure for integrated inductors which reduces effectively eddy currents induced into the lossy silicon substrate is introduced. The structure is based on a highly resistive area preventing currents in the substrate. Natural resources of an integrated circuit like pn-junctions are used to produce these areas. Estimation and optimization of the ideal distance between structure elements and reducing the inductor area are done. The effect is increased by connecting an external voltage supply to the structure. Measurement results show an increased quality factor of up to 20 which is an improvement of about 80%. A four layer thick metal 0.35μm BiCMOS process is used to reduce conductor resistance.
Keywords :
BiCMOS integrated circuits; Q-factor; inductors; p-n junctions; 0.35 micron; BiCMOS process; conductor resistance; differential planar spiral inductors; eddy currents; improved structure; integrated inductors; lossy silicon substrate; pn-junctions; quality factor; BiCMOS integrated circuits; Eddy currents; Electrical resistance measurement; Inductors; Integrated circuit measurements; Joining processes; Q factor; Silicon; Spirals; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave Conference, 2005 European
Print_ISBN :
2-9600551-2-8
Type :
conf
DOI :
10.1109/EUMC.2005.1608796
Filename :
1608796
Link To Document :
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