• DocumentCode
    453455
  • Title

    New modeling results for non-linear differential amplifier behavior, including two-tone TOI response

  • Author

    Dunsmore, Joel

  • Author_Institution
    Component Test Div. R&D, Agilent Technol., Santa Rosa, CA, USA
  • Volume
    1
  • fYear
    2005
  • fDate
    4-6 Oct. 2005
  • Abstract
    Previously, the author described a system that provides true differential and common-mode stimulus for CW and modulated RF signals, and presented results of non-linear operation of devices driven with such signals, which were compared with the same devices driven at the same levels using single-ended drive and calculating the differential response. Some devices showed no difference in the differential gain terms whether measured with true-mode or single ended measurements, and some showed substantial change in the differential gain compression when measured using true differential mode drive. A theoretical model was proposed which considers circuit topology differences to predict which devices will have non-linear characteristics that change depending upon the test methods. A new modeling approach is presented here which confirms these predictions, clearly identifies the underlying causes for the non-linear differential behavior and extends the results to modulated measurements such as TOI. Using these models, new effects of non-ideal measurements are discovered, pointing to yet more complex requirements for true-mode non-linear test.
  • Keywords
    differential amplifiers; network topology; nonlinear network analysis; CW signals; circuit topology; differential gain compression; differential response; modulated RF signals; modulated measurements; nonideal measurements; nonlinear device operation; nonlinear differential amplifier behavior; single ended measurements; true-mode measurements; two-tone TOI response; Circuit testing; Circuit topology; Differential amplifiers; Gain measurement; Impedance matching; Integrated circuit interconnections; Power measurement; Predictive models; RF signals; System testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Conference, 2005 European
  • Print_ISBN
    2-9600551-2-8
  • Type

    conf

  • DOI
    10.1109/EUMC.2005.1608865
  • Filename
    1608865