DocumentCode :
453472
Title :
Determination of complex permittivity and permeability of materials in rectangular waveguide using accurate hybrid numerical calculation
Author :
Miyagawa, Hayato ; Hirose, Keita ; Nishikawa, Toshio ; Wakino, Kikuo ; Kitazawa, Toshihide
Author_Institution :
Dept. of Electr. & Electron. Eng., Ritsumeikan Univ., Shiga, Japan
Volume :
1
fYear :
2005
fDate :
4-6 Oct. 2005
Abstract :
An effective simultaneous evaluation method for the complex permittivity and permeability of the specimen filling partially the rectangular waveguide is proposed. Electromagnetic field analysis for the evaluation is based on the extended spectral domain approach combined with the mode-matching method (ESDMM). ESDMM is accurate and more efficient than FEM and suitable for the iterative fitting to estimate the material characteristics. Microwave absorbing rubber sheet was measured over the X-band by the present method. The sample preparation and setting are far easy compared with conventional method, because it is not necessary to fill exactly the cross section of waveguide. The evaluated results by ESDMM for the several samples have showed good agreement with ones measured by conventional method.
Keywords :
dielectric materials; dielectric waveguides; electromagnetic fields; electromagnetic wave absorption; magnetic permeability; microwave materials; mode matching; permittivity; rubber; waveguide theory; complex permittivity; electromagnetic field analysis; extended spectral domain approach; hybrid numerical calculation; iterative fitting; microwave absorbing rubber sheet; mode-matching method; permeability; rectangular waveguide; Electromagnetic analysis; Electromagnetic fields; Electromagnetic waveguides; Filling; Mode matching methods; Permeability; Permittivity; Rectangular waveguides; Sheet materials; Waveguide components;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave Conference, 2005 European
Print_ISBN :
2-9600551-2-8
Type :
conf
DOI :
10.1109/EUMC.2005.1608903
Filename :
1608903
Link To Document :
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